Fabricante Electrónico | No. de pieza | Datasheet | Descripción Electrónicos |
Integrated Device Techn...
|
IDT74SSTUA32866 |
258Kb/19P |
1.8V CONFIGURABLE BUFFER WITH ADDRESS-PARITY TEST |
Texas Instruments
|
SN74SSTU32866A |
654Kb/35P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTUB32866 |
1Mb/33P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTUB32866 |
1Mb/38P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTU32866 |
714Kb/37P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32866A |
1Mb/37P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTUB32866 |
1Mb/39P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTUB32866 |
2Mb/42P |
25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868A |
770Kb/25P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868 |
981Kb/26P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32865 |
772Kb/21P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32865A |
773Kb/21P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
SN74SSTEB32866 |
1Mb/37P |
1.5V/1.8V 25-BIT CONFIGURABLE REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32865AZJBR |
728Kb/21P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868 |
434Kb/23P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
74SSTUB32868A |
768Kb/26P |
28-BIT TO 56-BIT REGISTERED BUFFER WITH ADDRESS-PARITY TEST |
Intersil Corporation
|
HSP45240 |
283Kb/13P |
Address Sequencer |
Rockchip Electronics Co...
|
RK3399 |
6Mb/824P |
Address Mapping |
Renesas Technology Corp
|
HSP45240 |
289Kb/13P |
Address Sequencer July 2004 |
Intersil Corporation
|
HSP45240 |
141Kb/6P |
Address Sequencer |